SIGIR 2010 - IRF booth

2010 | 07 | 19

IRF Booth SIGIR 2010IRF Booth SIGIR 2010


Session on Test Collections 7A

Thursday, 22nd July, 9:00-10:15
Chair: John Tait, Cheif Scientific Officer, IRF


  • The Effect of Assessor Error on IR System Evaluation
    Ben Carterette (University of Delaware), Ian Soboroff (NIST)
  • Building Reusable Test Collections Through Experimental Design
    Ben Carterette (University of Delaware), Evangelos Kanoulas (University of Sheffield), Virgil Pavlu (Northeastern University), Hui Fang (University of Delaware)
  • Do User Preferences and Evaluation measures Line Up?
    Mark Sanderson, Monica Lestari Paramita , Paul Clough, Evangelos Kanoulas (University of Sheffield)


SIGIR 2010 - IRF boothIRF Booth at SIGIR 2010

Visit us at our booth in the exhibition area. John Tait and Linda Andersson will be there during conference breaks.