SIGIR 2010 - IRF booth
2010 | 07 | 19
IRF Booth SIGIR 2010
Session on Test Collections 7A
Thursday, 22nd July, 9:00-10:15
Chair: John Tait, Cheif Scientific Officer, IRF
- The Effect of Assessor Error on IR System Evaluation
Ben Carterette (University of Delaware), Ian Soboroff (NIST)
- Building Reusable Test Collections Through Experimental Design
Ben Carterette (University of Delaware), Evangelos Kanoulas (University of Sheffield), Virgil Pavlu (Northeastern University), Hui Fang (University of Delaware)
- Do User Preferences and Evaluation measures Line Up?
Mark Sanderson, Monica Lestari Paramita , Paul Clough, Evangelos Kanoulas (University of Sheffield)
IRF Booth at SIGIR 2010
Visit us at our booth in the exhibition area. John Tait and Linda Andersson will be there during conference breaks.